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Creators/Authors contains: "Zhang, Yanwen"

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  1. ; ; ; ; (, MRS Communications)
    Abstract The temperature dependence of amorphization in a high-entropy pyrochlore, (Yb0.2Tm0.2Lu0.2Ho0.2Er0.2)2Ti2O7, under irradiation with 600 keV Xe ions has been studied using in situ transmission electron microscopy (TEM). The critical amorphization dose increases with temperature, and the critical temperature for amorphization is 800 K. At room temperature, the critical amorphization dose is larger than that previously determined for this pyrochlore under bulk-like 4 MeV Au ion irradiation but is similar to the critical doses determined in two other high-entropy titanate pyrochlores under 800 keV Kr ion irradiation using in situ TEM, which is consistent with reported behavior in simple rare-earth titanate pyrochlores. Graphical abstract 
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  2. ; ; ; ; ; ; ; ; ; (, Nanoscale)
    It is widely accepted that the interaction of swift heavy ions with many complex oxides is predominantly governed by the electronic energy loss that gives rise to nanoscale amorphous ion tracks along the penetration direction. 
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  3. ; ; ; ; ; ; ; ; ; ; et al (, Applied Physics Letters)
    In situ neutron diffraction experiments have been performed to investigate the deformation mechanisms on CoCrFeNi high entropy alloys (HEAs) with various amounts of doped Cu. Lattice strain evolution and diffraction peak analysis were used to derive the stacking fault probability, stacking fault energy, and dislocation densities. Such diffraction analyses indirectly uncovered that a lower degree of Cu doping retained the twinning behavior in undoped CoCrFeNi HEAs, while increasing the Cu content increased the Cu clusterings which suppressed twinning and exhibited prominent dislocation strengthening. These results agree with direct observations by transmission electron microscopy. 
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  4. ; ; ; ; ; (, Materials Science and Engineering: A)
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  5. ; ; ; ; ; ; ; ; (, Scripta Materialia)
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  6. ; ; ; ; ; ; (, Intermetallics)
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  7. ; ; ; ; ; ; ; ; ; ; et al (, Advanced Materials)
    null (Ed.)
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